An Improved Hierarchy Physical Design Flow for High Speed Circuits

被引:0
|
作者
Chen Y. [1 ]
Liang L. [1 ]
机构
[1] Institute of Microelectronics, Chinese Academy of Sciences, Beijing
基金
中国国家自然科学基金;
关键词
Area; Delay; High speed; Layout; Placement;
D O I
10.16339/j.cnki.hdxbzkb.2018.10.016
中图分类号
学科分类号
摘要
This paper proposed an improved hierarchical flow for physical design in deep sub-micron technology. This flow can reduce routing congestion and improve timing delay. The key point of this flow is to use the external connectivity information of the target block to design the floorplan, which could achieve a good place and route result in one iteration using quantitative analysis, saving time and efforts from multiple failed iterations. The proposed flow was tested on a large mux block in DSP design in SMIC 65 nm low leakage process, and the result showed it improved 20% in area and 35% in timing delay compared with the traditional flow. © 2018, Editorial Department of Journal of Hunan University. All right reserved.
引用
收藏
页码:115 / 120
页数:5
相关论文
共 8 条
  • [1] Sharma T., Stevens K.S., Physical design variation in relative timed asynchronous circuits, IEEE Computer Society Annual Symposium on VLSI, pp. 278-283, (2017)
  • [2] Gupta A., Rawat K., Pandey S., Et al., Physical design implementation of 32-bit AMBA ASB APB module with improved performance, International Conference on Electrical, Electronics, and Optimization Techniques, pp. 3121-3124, (2016)
  • [3] Sham C.W., Young E.F.Y., Lu J.W., Congestion prediction in early stages of physical design, ACM Transactions on Design Automation of Electronic Systems, 14, 1, (2009)
  • [4] Zeng H., IC Physical design methodology research under DSM, China Integrated Circuit, 19, 2, (2010)
  • [5] Shim S., Chung W., Shin Y., Lithography defect probability and its application to physical design optimization, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25, 1, pp. 271-285, (2017)
  • [6] Liu M., Sun W.Q., Wang W.Q., Et al., An automatic and practical flow for clock tree construction in physical design, 7th IEEE International Conference on Software Engineering and Service Science, pp. 671-674, (2016)
  • [7] Nassif S.R., Nam G.J., Banerjee S., Wire delay variability in nanoscale technology and its impact on physical design, 14th International Symposium on Quality Electronic Design, pp. 591-596, (2013)
  • [8] Thiele M., Bigalke S., Jens L., Exploring the use of the finite element method for electromigration analysis in future physical design, IEEE International Conference on Very Large Scale Integration, pp. 1-6, (2017)