Soft X-ray quantum efficiency of a commercial CMOS imaging sensor

被引:0
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作者
Packard, Colin M. [1 ]
Tammes, Steve [2 ]
Kaaret, Philip [1 ,3 ]
Deroo, Casey [1 ]
Mcchesney, Jessica L. [4 ]
Freeland, John W. [4 ]
Rodolakis, Fanny [4 ]
机构
[1] University of Iowa, Department of Physics and Astronomy, Iowa City,IA, United States
[2] University of Iowa, Department of Chemical and Biochemical Engineering, Iowa City,IA, United States
[3] NASA, Marshall Space Flight Center, Huntsville,AL, United States
[4] Advanced Photon Source, Argonne National Laboratory, Lemont,IL, United States
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30;
D O I
10.1117/1.JATIS.10.3.036001
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