Ranking and selection techniques with overlapping variance estimators for simulations

被引:0
|
作者
Healey, Christopher M. [1 ]
Goldsman, David [1 ]
Kim, Seong-Hee [1 ]
机构
[1] H. Milton Stewart School of Industrial and Systems Engineering, Georgia Institute of Technology, 765 Ferst Drive, Atlanta, GA 30332-0205, United States
基金
美国国家科学基金会;
关键词
D O I
10.1080/07474940903238334
中图分类号
O212 [数理统计];
学科分类号
摘要
Some ranking and selection (R&S) procedures for steady-state simulation require estimates of the asymptotic variance parameter of each system to guarantee a certain probability of correct selection. In this paper, we show that the performance of such R&S procedures depends highly on the quality of the variance estimates that are used. In fact, we study the performance of R&S procedures using three new variance estimators-overlapping area, overlapping Cramér-von Mises, and overlapping modified jackknifed Durbin-Watson estimators-that show better long-run performance than other estimators previously used in conjunction with R&S procedures for steady-state simulations. © Taylor & Francis Group, LLC.
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收藏
页码:459 / 474
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