Interface states of SiO2/SiC on (112¯0) and (0001) Si faces

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[1] Yano, H.
[2] Kimoto, T.
[3] Matsunami, H.
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Yano, H. | 2001年 / Trans Tech Publ, Uetikon-Zuerich, Switzerland卷 / 353-356期
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