Fabry-Perot-type antireflective coating for deep-ultraviolet binary photomask applications

被引:0
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作者
Chen, Hsuen-Li [1 ]
Chu, Tieh-Chi [1 ]
Hsu, Chien-Kui [1 ]
Ko, Fu-Hsiang [1 ]
Huang, Tiao-Yuan [1 ]
机构
[1] National Nano Device Laboratory, 1001-1 Ta Hsueh Road, Hsinchu, Taiwan
来源
Applied Optics | 2002年 / 41卷 / 19期
关键词
Chromium compounds - Light absorption - Light interference - Masks - Photolithography;
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摘要
We demonstrate an antireflective coating structure, which is based on the three-layer metal interference called the Fabry-Perot structure, for a deep-ultraviolet binary mask. The antireflective coating structure is composed of a metal-oxide-metal stack. By addition of different optimized structures, reflectances of less than 1.5% at both 248 and 193 nm have been achieved. At the three-layer Fabry-Perot structure, the bottom chrome layer provides suitable absorption. By controlling the thickness of the intermediate silicon oxide layer, we can tune the minimum-reflection regime to the desired exposure wavelength. The top metal layer can prevent charge accumulation during e-beam writing. © 2002 Optical Society of America.
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页码:3961 / 3965
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