Comment: Insight: Non-Destructive Testing and Condition Monitoring

被引：0

作者：

Georgiou, G.A. ^{[1
]}

机构：

[1] British Institute of Non-Destructive Testing

来源：

Insight: Non-Destructive Testing and Condition Monitoring | 2010年 / 52卷 / 01期

关键词：

D O I：

10.1784/insi.2010.52.1.2

中图分类号：

学科分类号：

摘要：

引用

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[1] Insight: Non-Destructive Testing and Condition Monitoring: Comment
Smith, Robert A.
Insight: Non-Destructive Testing and Condition Monitoring, 2010, 52 (03):
[2] Insight: Non-Destructive Testing and Condition Monitoring - Comment
Brett, C.
Insight: Non-Destructive Testing and Condition Monitoring, 2001, 43 (09):
[3] Insight: Non-Destructive Testing and Condition Monitoring - Comment
Rudlin, John
Insight: Non-Destructive Testing and Condition Monitoring, 2002, 44 (05):
[4] Insight: Non-Destructive Testing and Condition Monitoring: Comment
Lavender, Steve J.
Insight: Non-Destructive Testing and Condition Monitoring, 2011, 53 (01):
[5] Insight: Non-Destructive Testing and Condition Monitoring - Comment
Shipp, Robin
Insight: Non-Destructive Testing and Condition Monitoring, 2003, 45 (02):
[6] Insight: Non-Destructive Testing and Condition Monitoring: Comment
Chapman, Bob
Insight: Non-Destructive Testing and Condition Monitoring, 2010, 52 (12):
[7] Insight - Non-Destructive Testing and Condition Monitoring: Comment
Halmshaw, R.
Insight: Non-Destructive Testing and Condition Monitoring, 2002, 44 (10):
[8] Insight: Non-Destructive Testing and Condition Monitoring: Comment
Gardner, W.E.
Insight: Non-Destructive Testing and Condition Monitoring, 2010, 52 (02):
[9] Insight: Non-Destructive Testing and Condition Monitoring: Comment
Gardner, W.E.
Insight: Non-Destructive Testing and Condition Monitoring, 2010, 52 (07):
[10] Insight: Non-Destructive Testing and Condition Monitoring: Comment
Rudiin, J.R.
Insight: Non-Destructive Testing and Condition Monitoring, 2003, 45 (05):

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