FDTD analysis of dielectric-loaded longitudinally slotted rectangular waveguides

被引：0
|
作者：
Al-Rizzo, Hussain M. [1 ]
Younies, Hassan Z. [2 ]
Clark, Ken G. [3 ]
Tranquilla, Jim M. [3 ]
机构：
[1] Systems Engineering Dept., Donaghey Coll. Info. Sci. Syst. Eng., University of Arkansas, Little Rock, AR, United States
[2] Michael DeGroote School of Business, McMaster University, Hamilton, Ont., Canada
[3] EMR Microwave Technology Corporation, Fredericton, NB, Canada
来源：
| 2003年 / International Microwave Power Institute卷 / 38期
关键词：
Finite Difference Time Domain technique - Probe excited slot - Slotted rectangular waveguide - Surface Impedance Boundary Condition;
D O I：
10.1080/08327823.2003.11688497
中图分类号：
学科分类号：
摘要：
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