X-ray spectrometer for investigation of layers on liquid surface using characteristic fluorescence radiation

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作者：
Zheludeva, S.I.
Novikova, N.N.
Tereshchenko, E.Yu.
Shilin, Yu.N.
Shishkov, V.A.
Myagkov, I.V.
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Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya | 2001年 / 07期
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页码：35 / 40
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