Preparation of tin-based oxides thin films and its' electrochemical properties

被引:0
|
作者
Zhao, Shengli [1 ]
Wen, Jiuba [1 ]
Li, Qian [1 ]
Fu, Zhengwen [2 ]
Qin, Qizong [2 ]
机构
[1] Materials Institute, Henan University of Science and Technology, Luoyang 471003, China
[2] Department of Chemistry, Fudan University, Shanghai 200433, China
关键词
Evaporation - Morphology - Nanostructured materials - Nonmetallic materials - Oxidation - Structure (composition) - Surfaces - Tin;
D O I
10.1016/j.ab.2005.10.005
中图分类号
学科分类号
摘要
A dense tin-based oxide (SnOx) thin film with smooth surface and uniform thickness was fabricated by vacuum thermal evaporation of Sn and subsequent thermal oxidation in oxygen ambient, and the influence of oxidation temperature on its morphology, structure and properties was investigated. The results showed that SnOx film is composed by nanocrystalline grains with homogeneous distribution and the grain size increases with oxidation temperature. In first cycle, the reversible capacity of this SnOx film decreases and capacity loss increases with the oxidation temperature. At 600°C oxidation temperature for 2 h, SnOx film possesses best rechargeable property.
引用
收藏
页码:262 / 266
相关论文
共 50 条
  • [1] Preparation of tin-based perovskite solar cell thin films assisted by stannous fluoride
    Xiu, Zhaohong
    ENERGY REPORTS, 2022, 8 : 1079 - 1089
  • [2] Optoelectronic Properties of Tin-Based Hybrid Metal Halide Perovskite Thin Films for Photovoltaics
    Milot, Rebecca L.
    Johnston, Michael B.
    Herz, Laura M.
    2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2019,
  • [3] Review of the Thermal and Mechanical Stability of TiN-based Thin Films
    Department of Physics, Linköping University, Linköping, Sweden
    不详
    不详
    不详
    Int. J. Mater. Res., 10 (803-813):
  • [4] Review of the thermal and mechanical stability of TiN-based thin films
    Hultman, L
    Engström, C
    Birch, J
    Johansson, MP
    Odén, M
    Karlsson, L
    Ljungcrantz, H
    ZEITSCHRIFT FUR METALLKUNDE, 1999, 90 (10): : 803 - 813
  • [5] Fluorine ion induced phase evolution of tin-based perovskite thin films: structure and properties
    Wu, Junsheng
    Fang, Fang
    Zhao, Zhuo
    Li, Tong
    Ullah, Rizwan
    Lv, Zhe
    Zhou, Yanwen
    Sawtell, David
    RSC ADVANCES, 2019, 9 (63) : 37119 - 37126
  • [6] Electrochemical lithiation of tin and tin-based intermetallics and composites
    Winter, M
    Besenhard, JO
    ELECTROCHIMICA ACTA, 1999, 45 (1-2) : 31 - 50
  • [7] Nanostructured TiN-based thin films by a novel and facile synthetic route
    Zheng, Jianyun
    Lv, Yanhong
    Xu, Shusheng
    Han, Xi
    Zhang, Shuaituo
    Hao, Junying
    Liu, Weimin
    MATERIALS & DESIGN, 2017, 113 : 142 - 148
  • [8] Electrochemical characterization of various tin-based oxides as negative electrodes for rechargeable lithium batteries
    Nam, SC
    Paik, CH
    Cho, WI
    Cho, BW
    Chun, HS
    Yun, KS
    JOURNAL OF POWER SOURCES, 1999, 84 (01) : 24 - 31
  • [9] Preparation and electrical properties of MOCVD TiN thin films
    Yi, Wanbing
    Zhang, Wenjie
    Wu, Jin
    Zou, Shichang
    Cailiao Yanjiu Xuebao/Chinese Journal of Materials Research, 2006, 20 (02): : 213 - 216
  • [10] Investigation of tin-based alternatives for cadmium in optoelectronic thin-films materials
    Wakeham, Steven
    Hawkins, Gary
    Henderson, Graham
    Carthey, Nicholas
    APPLIED OPTICS, 2008, 47 (13) : C206 - C213