Image processing technique for microstructure measurement system

被引：0
|
作者：
Li, Luosheng [1 ]
Bai, Lifen [1 ]
Li, Qingxiang [1 ]
Yu, Shui [1 ]
He, Cunfu [1 ]
机构：
[1] Dept. of Precision Instrum., Tsinghua Univ., Beijing 100084, China
来源：
Qinghua Daxue Xuebao/Journal of Tsinghua University | 2001年 / 41卷 / 08期
关键词：
Microstructure measurement - Multi accumulation phase;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：45 / 48
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