Electron cyclotron resonance ion source for material surface treatment

被引:0
|
作者
Ming, Jianchuan [1 ]
Guo, Zhiyu [1 ]
Peng, Shixiang [1 ]
机构
[1] State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China
来源
Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams | 2012年 / 24卷 / 12期
关键词
D O I
10.3788/HPLPB20122412.2911
中图分类号
学科分类号
摘要
引用
收藏
页码:2911 / 2914
相关论文
共 50 条
  • [1] Electron cyclotron resonance plasma ion source for material depositions
    Delaunay, M
    Touchais, E
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (06): : 2320 - 2324
  • [2] Electron cyclotron resonance ion source for ion thruster
    Satori, S
    Nishiyama, K
    Kuninaka, H
    Kuriki, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (1A): : 274 - 275
  • [3] Simple electron cyclotron resonance ion source
    Rev Sci Instrum, 4 (1634):
  • [4] A simple electron cyclotron resonance ion source
    Welton, RF
    Moran, TF
    Feeney, RK
    Thomas, EW
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (03): : 1216 - 1216
  • [5] A simple electron cyclotron resonance ion source
    Welton, RF
    Moran, TF
    Feeney, RK
    Thomas, EW
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (04): : 1634 - 1637
  • [6] Electron cyclotron resonance negative ion source
    Fukumasa, O
    Matsumori, M
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (02): : 935 - 938
  • [7] Pure Material Vapor Source by Induction Heating Evaporator for an Electron Cyclotron Resonance Ion Source
    Matsui, Y.
    Watanabe, F.
    Satani, T.
    Muramatsu, M.
    Tanaka, K.
    Kitagawa, A.
    Yoshida, Y.
    Sato, F.
    Kato, Y.
    Iida, T.
    ION IMPLANTATION TECHNOLOGY 2008, 2008, 1066 : 529 - +
  • [8] Numerical model of electron cyclotron resonance ion source
    Mironov, V.
    Bogomolov, S.
    Bondarchenko, A.
    Efremov, A.
    Loginov, V.
    PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 2015, 18 (12):
  • [9] Compact electron cyclotron resonance proton ion source
    Boukari, F.
    Wartski, L.
    Roy, V.
    Schwebel, C.
    Coste, Ph.
    Aubert, J.
    Review of Scientific Instruments, 1996, 67 (3 pt 2):