Measurement of X-ray relative dose-enhancement factor for CMOS device using bi-laminate structure and its simulation

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作者：
Guo, Hong-Xia
Chen, Yu-Sheng
Zhang, Yi-Men
Zhou, Hui
Wu, Guo-Rong
Lin, Dong-Sheng
Han, Fu-Bin
Guan, Ying
Gong, Jian-Cheng
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Hedianzixue Yu Tance Jishu/Nuclear Electronics & Detection Technology | 2002年 / 22卷 / 01期
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