Time-resolved emission: Distortion-free measurements of analog circuits by time-resolved emission

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作者：
Sarault, Keith R. [1 ]
Boon, Gerben [1 ]
机构：
[1] NXP Semiconductors, Nijmegen, Netherlands
来源：
Electronic Device Failure Analysis | 2009年 / 11卷 / 02期
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页码：6 / 14
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