共 50 条
- [1] Process design for preventing the gate oxide thinning in the integration of dual gate oxide transistor JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (4B): : 2404 - 2409
- [6] Charging damage in dual gate oxide process SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1 AND 2, PROCEEDINGS, 2001, : 970 - 973
- [7] Impact of boron penetration on gate oxide reliability and device performance in a dual gate oxide process ADVANCED MICROELECTRONIC PROCESSING TECHNIQUES, 2000, 4227 : 112 - 117
- [8] Gate Oxide Thickness and Drain Current Variation of Dual Gate Tunnel Field Effect Transistor INTERNATIONAL JOURNAL OF ENGINEERING, 2024, 37 (03): : 520 - 528