Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II: design, alignment and data acquisition

被引:1
|
作者
Tayal, Akhil [1 ]
Coburn, David Scoft [1 ]
Abel, Donald [1 ]
Rakitin, Max [1 ]
Ivashkevych, Oksana [1 ]
Wlodek, Jakub [1 ]
Wierzbicki, Dominik [1 ,2 ]
Xu, Weihe [1 ]
Nazaretski, Evgeny [1 ]
Stavitskia, Eli [1 ]
Leshcheva, Denis [1 ]
机构
[1] Brookhaven Natl Lab, Natl Synchrotron Light Source 2, Upton, NY 11973 USA
[2] AGH Univ Sci & Technol, Fac Energy & Fuels, Al A Mickiewicza 30, PL-30059 Krakow, Poland
关键词
X-ray spectroscopy; X-ray emission spectrometers; Johann geometry; ABSORPTION SPECTROSCOPY; EMISSION SPECTROSCOPY; XAS; FLUORESCENCE; INSIGHTS; EXAFS; XES;
D O I
10.1107/S1600577524009342
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5-2 eV range, depending on the element and/or emission line, providing detailed insights into the local electronic and geometric structure of materials. It serves a diverse user community, including fields such as physical, chemical, biological, environmental and materials sciences. This article details the mechanical design, alignment procedures and data-acquisition scheme of the spectrometer, with a particular focus on the continuous asynchronous data-acquisition approach that significantly enhances experimental efficiency.
引用
收藏
页码:1609 / 1621
页数:13
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