Computer-aided design of electron guns and deflection yokes: a review (Part 2)

被引：2
|
作者：
Alig, R. Casanova [1 ,2 ]
Fields, John R. [2 ]
机构：
[1] SID
[2] Sarnoff Corp., SRI International, CN5300, Princeton, NJ 08543-5300, United States
来源：
Journal of the Society for Information Display | 2000年 / 8卷 / 02期
关键词：
Beam simulation - Paraxial optics - Raster pattern - Spherical aberration;
D O I：
10.1889/1.1828745
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：99 / 113
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