DFT circuit designers battle IC, PC-board complexities

被引：0
|
作者：
Allan, Roger
机构：
来源：
Electronic Design | 2003年 / 51卷 / 13期
关键词：
Design for testability - Integrated circuit design - Integrated circuits;
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学科分类号：
摘要：
A review on design for test (DFT) circuit designers was presented. The latest DFT methods involved on-chip test subblocks to minimize testing costs. Many studies by test engineers showed that using functional testing for DFT-validated integrated circuits (IC) designs do not necessarily improve end-product quality.
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页码：94 / 96
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