Erosion characteristics of SF6 circuit breaker contacts based on dynamic contact resistance measurement

被引：0
|
作者：
Lan L. [1 ]
Chen G. [1 ]
Wen X. [1 ]
Wu Y. [1 ]
机构：
[1] School of Electrical Engineering, Wuhan University, Wuhan
来源：
Chen, Gong (gongchen714@163.com) | 1731年 / Science Press卷 / 42期
关键词：
Condition parameter; Contact; Dynamic contact resistance; Dynamic contact resistance curve as a function of contact travel; Electrical life prediction; Erosion; Erosion mechanism; SF[!sub]6[!/sub] circuit breaker;
D O I：
10.13336/j.1003-6520.hve.20160616008
中图分类号：
学科分类号：
摘要：
To study the contact erosion characteristics of SF6 circuit breaker during opening operation, the erosion test was conducted on the tested SF6 circuit breaker and the dynamic resistance curves as a function of contact travel was obtained in different levels of degradation of contacts by dynamic contact resistance measurement. Some parameters of contact condition were extracted from the curve. According to the variation of these diagnostic parameters, the following results can be obtained. A minimum value of contact travel is obtained to be 14.2 mm. The value of contact resistance has a standard range, which is 50~150 μΩ for main contact and 200~400 μΩ for arcing contact.The length decrement of arcing contact is 0.318 mm for each erosion test. According to these results, we analyzed the contact material erosion process during the opening operation and the impact on the circuit breaker characteristics. Meanwhile, the length decrement of arcing contact for each erosion test is calculated to be 0.268 mm, which is close to the measured value of 0.318 mm. Eventually, the preliminary prediction method for the electrical life of SF6 circuit breaker was summarized. © 2016, High Voltage Engineering Editorial Department of CEPRI. All right reserved.
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页码：1731 / 1738
页数：7
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