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- [1] Atomic force microscopic analyses of heavy ion tracks in CR-39 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1999, 152 (02): : 349 - 356
- [2] Atomic force microscopic analyses of heavy ion tracks in CR-39 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 152 (2-3): : 349 - 356
- [3] Measurement of bulk etch rate of CR-39 with atomic force microscopy Nucl Instrum Methods Phys Res Sect B, 1-2 (111-116):
- [4] Measurement of bulk etch rate of CR-39 with atomic force microscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 142 (1-2): : 111 - 116
- [10] High resolution imaging for charged particles using CR-39 and atomic force microscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 422 (1-3): : 751 - 755