Acceleration of carbon clusters and observation of their tracks in CR-39 by atomic force microscopy

被引:0
|
作者
Zhao, Kui
Wu, Xiukun
Guo, Jiyu
Ni, Meinan
Sui, Li
Mei, Junping
Bao, Yiwen
You, Qubo
Zhou, Lipeng
机构
来源
He Jishu/Nuclear Techniques | 2002年 / 25卷 / 07期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [1] Atomic force microscopic analyses of heavy ion tracks in CR-39
    Yamamoto, M.
    Yasuda, N.
    Kurano, M.
    Kanai, T.
    Furukawa, A.
    Ishigure, N.
    Ogura, K.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1999, 152 (02): : 349 - 356
  • [2] Atomic force microscopic analyses of heavy ion tracks in CR-39
    Yamamoto, M
    Yasuda, N
    Kurano, M
    Kanai, T
    Furukawa, A
    Ishigure, N
    Ogura, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 152 (2-3): : 349 - 356
  • [3] Measurement of bulk etch rate of CR-39 with atomic force microscopy
    Natl Inst of Radiological Science, Chiba, Japan
    Nucl Instrum Methods Phys Res Sect B, 1-2 (111-116):
  • [4] Measurement of bulk etch rate of CR-39 with atomic force microscopy
    Yasuda, N
    Yamamoto, M
    Miyahara, N
    Ishigure, N
    Kanai, T
    Ogura, K
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 142 (1-2): : 111 - 116
  • [5] An atomic force microscopy investigation of the tracks made by C1+-C4+ bombardment on CR-39 detectors
    Zhao, K
    Wu, XK
    Guo, JY
    Sui, L
    Mei, JP
    Ni, MN
    Bao, YW
    CHINESE PHYSICS LETTERS, 2003, 20 (11) : 1947 - 1949
  • [6] Measuring depths of sub-micron tracks in a CR-39 detector from replicas using Atomic Force Microscopy
    Yu, KN
    Ng, FMF
    Nikezic, D
    RADIATION MEASUREMENTS, 2005, 40 (2-6) : 380 - 383
  • [7] Analysis of short-range tracks and large track fluences in CR-39 PNTD using atomic force microscopy
    Johnson, C. E.
    Benton, E. R.
    Yasuda, N.
    Benton, E. V.
    RADIATION MEASUREMENTS, 2009, 44 (9-10) : 742 - 745
  • [8] Submicron imaging for charged particles using CR-39 with atomic force microscopy
    Takahashi, H
    Kaizuka, Y
    Nakazawa, M
    Yasuda, N
    Yamamoto, M
    PHYSICA MEDICA, 1997, 13 : 159 - 161
  • [9] Extremely high dose neutron dosimetry using CR-39 and atomic force microscopy
    Yasuda, N.
    Koguchi, Y.
    Tsubomatsu, M.
    Takagi, T.
    Kobayashi, I.
    Tsuruta, T.
    Morishima, H.
    RADIATION PROTECTION DOSIMETRY, 2006, 120 (1-4) : 470 - 474
  • [10] High resolution imaging for charged particles using CR-39 and atomic force microscopy
    Takahashi, H
    Amemiya, K
    Kaizuka, Y
    Nakazawa, M
    Yasuda, N
    Yamamoto, M
    Sakai, T
    Kamiya, T
    Okada, S
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1999, 422 (1-3): : 751 - 755