Enhanced technique for built-in self-test of sequential logic

被引：0

作者：

Chien, Benedict ^{[1
]}

Simmons, Stan ^{[1
]}

机构：

[1] Dept. of Electrical Engineering, Queen's University

来源：

Canadian Conference on Electrical and Computer Engineering | 2004年 / 4卷

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Computer simulation - Control systems - Cyclic voltammetry - Design for testability - Digital circuits - Electric network analysis - Microprocessor chips - Pattern matching

引用

页码：2009 / 2012

共 50 条

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