Shielding microelectronics against space radiation

被引：0
|
作者：
Swain, Kartika C. [1 ]
Bhat, B.R. [1 ]
Sahu, R.P. [1 ]
机构：
[1] Parts and Materials Division, Systems Reliability Group, ISRO Satellite Centre, Bangalore-560017, India
来源：
Journal of Spacecraft Technology | 2000年 / 10卷 / 02期
关键词：
Integrated circuits - Microelectronic processing - Radiation shielding - Satellites;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Microelectronics components like Hybrid Micro Circuits, ICs and ASICs face a hostile radiation environment in the space. The radiation environment consists of high-energy charged particles like electrons, protons and electro-magnetic rays of high and low energies that may cause degradation of microelectronics components. The established methods of radiation protection against space radiation use either rad-hard components or local shielding to protect the components from the harmful effects of radiation. This paper discusses the local shielding concepts taking examples of HMCs and ASICs used in ISRO Satellite INSAT-2E.
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页码：19 / 23
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