A new software reliability framework - An extended Cleanroom model

被引：0
|
作者：
Yao, W. [1 ]
Yang, X. [1 ]
Men, C. [1 ]
Zuo, D. [1 ]
机构：
[1] Dept. of Computer Science and Eng., Harbin Institute of Technology, Harbin 150001, China
来源：
High Technology Letters | 2001年 / 7卷 / 02期
关键词：
Extended cleanroom model (ECM);
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：42 / 46
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