2018 atomic spectrometry update-a review of advances in X-ray fluorescence spectrometry and its special applications

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[1] Vanhoof, Christine
[2] Bacon, Jeffrey R.
[3] Ellis, Andrew T.
[4] Vincze, Laszlo
[5] Wobrauschek, Peter
来源：
Vanhoof, Christine (christine.vanhoof@vito.be) | 2018年 / Royal Society of Chemistry卷 / 33期
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one dimensional two dimensional three dimensional anno domini atomic force microscopy application-specic integrated circuit Atomic Spectrometry Update Federal Institute for Materials Research and Testing (Germany) before Christ brominated diphenyl ether brominated ame retardant collimating channel array charge coupled detector Canadian Light Source certied reference material computed tomography data acquisition dimethyl ether discrete wavelet transform energy dispersive energy dispersive X-ray spectrometry energy dispersive X-ray uorescence European Synchrotron Radiation Facility European Union bre optics reectance spectrometry fundamental parameter Fourier ring correlation full width at half maximum gas chromatography mass spectrometry gas electron multiplier grazing emission X-ray uorescence grazing incidence X-ray uorescence hand-held International Atomic Energy Agency inductively coupled plasma optical emission spectrometry inductively coupled plasma mass spectrometry infrared International Organization for Standardization K-line X-ray uorescence laser ablation limit of detection laser-produced plasma method detection limit micro-orice uniform-deposit impactor nanoparticle National Synchrotron Light Source peak-to-background ratio principal component analysis particulate matter polymethylmethacrylate photovoltaic reference material relative standard deviation relative sensitivity factor;
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    Vanhoof, Christine
    Bacon, Jeffrey R.
    Ellis, Andrew T.
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