Temperature analysis of parallel-connected IGBTs under PWM operating conditions using a physics model

被引:0
|
作者
Horiguchi, Takeshi [1 ]
Tsukamoto, Kohei [2 ]
Tominaga, Shinji [2 ]
Nishimura, Tadashi [2 ]
Fujita, Hideaki [2 ]
Akagi, Hirofumi [2 ]
Kinouchi, Shin-Ichi [1 ]
Oi, Takeshi [1 ]
Koyama, Masato [1 ]
机构
[1] Advanced Technology R and D Center, Mitsubishi Electric Corporation, 8-1-1, Tsukaguchi-Honmachi, Amagasaki 661-8661, Japan
[2] Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1, O-okayama, Meguro-ku, Tokyo 152-8552, Japan
关键词
Ambipolar diffusion equation - Device characteristics - Electro-thermal simulation - Excess carrier distribution - Junction temperatures - Parallel connections - Physics modeling - Temperature differences;
D O I
10.1541/ieejias.134.486
中图分类号
学科分类号
摘要
This paper presents a physics-based IGBT model and a junction temperature analysis of parallel-connected IGBTs under PWM operating conditions using a physics-based IGBT model. The authors developed a physics-based IGBT model in which the excess carrier distribution within a drift region is represented using a one-dimentional ambipolar diffusion equation. The physics-based IGBT model makes it possible to predict losses and switching waveforms for converter applications. IGBTs are connected in parallel for medium- or large-capacity converters. In these applications, a transient current imbalance might occur owing to a difference in the wiring inductance or device characteristics between the IGBTs. An experiment shows that a difference in the wiring inductance between the two IGBTs causes a transient current imbalance, and the result is in excellent agreement with the result of a simulation using the physics-based IGBT model. The two parallel-connected IGBTs in this study correspond to a power module for 3.7kW motor drives, and the junction temperatures of both IGBTs are simulated by electro-thermal simulation under the following two conditions: a difference in the wiring inductance and a difference in the device characteristics. The temperature difference between the two IGBTs is approximately 4-7°C under the applied conditions: a wiring inductance mismatch (20 nH) and a threshold voltage mismatch (0.5V). The validity of the physics-based IGBT model is verified, and the model is found to be very useful when designing power converters. © 2014 The Institute of Electrical Engineers of Japan.
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页码:486 / 495
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