Characterization of organic/metal interfaces using angle-resolved X-ray photoelectron spectroscopy

被引：0
|
作者：
Ito, Eisuke [1 ]
Hara, Masahiko [1 ,2 ]
机构：
[1] Local Spatio-Temporal Functions Laboratory, Frontier Research System, RIKEN, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan
[2] Department of Electronic Chemistry, Interdisciplinary School of Engineering, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8502, Japan
来源：
Japanese Journal of Applied Physics | 2008年 / 47卷 / 2 PART 2期
关键词：
23;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
页码：1393 / 1396
相关论文
共 50 条
  • [1] Characterization of organic/metal interfaces using angle-resolved X-ray photoelectron spectroscopy
    Ito, Eisuke
    Hara, Masahiko
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (02) : 1393 - 1396
  • [2] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    FADLEY, CS
    [J]. PROGRESS IN SURFACE SCIENCE, 1984, 16 (03) : 275 - 388
  • [3] ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY FOR THE CHARACTERIZATION OF GAAS(001) SURFACES
    ALNOT, P
    OLIVIER, J
    WYCZISK, F
    FADLEY, CS
    [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1987, 43 (3-4) : 263 - 286
  • [4] Simulation of parallel angle-resolved X-ray photoelectron spectroscopy data
    Tasneem, G.
    Werner, W. S. M.
    Smekal, W.
    Powell, C. J.
    [J]. SURFACE AND INTERFACE ANALYSIS, 2010, 42 (6-7) : 1072 - 1075
  • [5] A THEORY OF QUANTITATIVE ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    TILININ, IS
    JABLONSKI, A
    LESIAKORLOWSKA, B
    [J]. VACUUM, 1995, 46 (5-6) : 613 - 616
  • [6] APPLICATION OF ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY TO THE STUDY OF GAAS(001) SURFACES AND METAL GAAS(001) INTERFACES
    LEPINE, B
    QUEMERAIS, A
    JEZEQUEL, G
    POLLINI, I
    [J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 28 (1-3): : 527 - 530
  • [7] FOCUSING AND DIFFRACTION EFFECTS IN ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY
    POON, HC
    TONG, SY
    [J]. PHYSICAL REVIEW B, 1984, 30 (10): : 6211 - 6213
  • [8] Influence of elastic scattering of photoelectrons on angle-resolved x-ray photoelectron spectroscopy
    Kimura, Kenji
    Nakajima, Kaoru
    Conard, Thierry
    Vandervorst, Wilfried
    [J]. APPLIED PHYSICS LETTERS, 2007, 91 (10)
  • [9] Angle-resolved X-ray photoelectron spectroscopy of the surface of imidazolium ionic liquids
    Lockett, Vera
    Sedev, Rossen
    Bassell, Chris
    Ralston, John
    [J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2008, 10 (09) : 1330 - 1335
  • [10] Analysis of Layers and Interfaces in a Multi-Layer System and Schematic Simulation Using Angle-Resolved X-ray Photoelectron Spectroscopy
    Choi, Sun Gyu
    Park, Hyung-Ho
    Jeon, Hyeongtag
    Chang, Ho Jung
    [J]. JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, 2009, 6 (11) : 2398 - 2401
12345