Multiscale entropy complexity analysis of metallic interconnection electromigration noise

被引：0
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作者：
He, Liang
Du, Lei
Zhuang, Yi-Qi
Li, Wei-Hua
Chen, Jian-Ping
机构：
[1] School of Technical Physics, Xidian University, Xi'an 710071, China
[2] School of Microelectronics, Xidian University, Xi'an 710071, China
来源：
Wuli Xuebao/Acta Physica Sinica | 2008年 / 57卷 / 10期
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摘要：
In order to solve the limitation of traditional frequency-domain analysis in Al interconnection electromigration noise, the multiscale entropy (MSE) method is proposed to analyze the electromigration noise time series. The result shows that at the early stage, electromigration noise is irregular, the noise complexity is large, and with the occurrence of nucleation, the electromigration noise becomes more regular, and the complexity decreases obviously. It indicates that the disorder degree of electromigration system decreases continually. Compared with traditional parameters, MSE can be used to successfully characterize electromigration process.
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页码：6545 / 6550
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