Static compaction techniques to control scan vector power dissipation

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作者：
Sankaralingam, Ranganathan [1 ]
Oruganti, Rama Rao [1 ]
Touba, Nur A. [1 ]
机构：
[1] Univ of Texas, Austin, United States
来源：
Proceedings of the IEEE VLSI Test Symposium | 2000年
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页码：35 / 40
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