Self-organized criticality - A model for recrystallization?

被引：0

作者：

Wroblewski, T. ^{[1
]}

机构：

[1] Hamburger Synchrotronstrahlungslabor HASYLAB, Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany

来源：

International Journal of Materials Research | 2002年 / 93卷 / 12期

关键词：

Cold rolling - Stochastic systems - Metal cladding - X ray diffraction - Stochastic models;

D O I：

10.1515/ijmr-2002-0211

中图分类号：

学科分类号：

摘要：

A novel X-ray diffraction method, allowing the position-resolved imaging of a polycrystalline specimen using the diffracted radiation, was applied for in situ investigation of recrystallization of cold-rolled copper. A large area of the specimen could be observed simultaneously, yielding information about nucleation and growth of many individual crystallites. The recrystallization process showed a stochastic behavior which can be described by the model of self-organized criticality. © 2002 Carl Hanser Verlag, München.

引用

页码：1228 / 1232

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