An in situ transmission electron microscope investigation into grain growth and ordering of sputter-deposited nanocrystalline Ni3Al thin films

被引：0
|
作者：
Ng, H.P. [1 ]
Ngan, A.H.W. [1 ]
机构：
[1] Lab. des Mat. et du Genie Physique, ENSPG-INPG UM 5628, BP 46, 38402, St. Martin d'Heres, France
来源：
| 2002年 / Materials Research Society卷 / 17期
关键词：
Arrhenius rate law - Grain coalescence - Isothermal heating - Nickel aluminide;
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