A method for scan test power optimization based on voltage control

被引：0
|
作者：
Zhang, Hong-Nan [1 ]
Wen, Yue-Rong [1 ]
Deng, Rong [2 ]
机构：
[1] College of Physics and Microelectronics Science, Hunan Univ., Changsha, Hunan 410082, China
[2] College of Electronics and Communication Engineering, Changsha Univ., Changsha, Hunan 410003, China
来源：
Hunan Daxue Xuebao/Journal of Hunan University Natural Sciences | 2011年 / 38卷 / 01期
关键词：
Combination logic - Dynamic Power - Scan tests - Static power - Test signal;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
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页码：40 / 43
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