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A formal goodness-of-fit test for spatial binary Markov random field models

被引：0
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作者：
Biswas, Eva [1 ]
Kaplan, Andee [2 ]
Kaiser, Mark S. [1 ]
Nordman, Daniel J. [1 ]
机构：
[1] Department of Statistics, Iowa State University, 2438 Osborn Dr, Ames,IA,50011, United States
[2] Department of Statistics, Colorado State University, 102 Statistics Building, Fort Collins,CO,80523, United States
来源：
Biometrics | 2024年 / 80卷 / 04期
关键词：
D O I：
10.1093/biomtc/ujae119
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