Common-path confocal interferometric surface plasmon microscopy

被引：0
|
作者：
School of Automation Science and Electrical Engineering, Beijing University of Aeronautics and Astronautics, Beijing [1 ]
100083, China
不详 [2 ]
100872, China
机构：
来源：
Beijing Hangkong Hangtian Daxue Xuebao | / 7卷 / 1330-1335期
关键词：
Environmental requirement - High signal-to-noise ratio - High spatial resolution - Image contrasts - Optical axis - Piezo electrics - Relative phase - Spatial resolution;
D O I：
10.13700/j.bh.1001-5965.2016.0526
中图分类号：
学科分类号：
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