Statistical static timing analysis for circuit aging prediction

被引：0
|
作者：
Shengyu, Duan [1 ,2 ]
Dongyao, Zhai [3 ]
Yue, Lu [3 ]
机构：
[1] Shanghai Engineering Research Center of Intelligent Computing System, Shanghai University, Shanghai,200444, China
[2] State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing,100190, China
[3] School of Electronics and Computer Science, University of Southampton, Southampton, United Kingdom
来源：
Journal of China Universities of Posts and Telecommunications | 2021年 / 28卷 / 02期
关键词：
We appreciate the High Performance Computing Center of Shanghai University; and Shanghai Engineering Research Center of Intelligent Computing System (19DZ2252600) for providing the computing resources. This work was supported by State Key Laboratory of Computer Architecture ( Institute of Computing Technology; Chinese Academy of Sciences) (CARCH201909);
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页码：124 / 23
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