REFICS: Assimilating Data-Driven Paradigms into Reverse Engineering and Hardware Assurance on Integrated Circuits

被引：0
|
作者：
Wilson, Ronald [1 ]
Lu, Hangwei [1 ]
Zhu, Mengdi [1 ]
Forte, Domenic [1 ]
Woodard, Damon L. [1 ]
机构：
[1] Florida Institute for Cybersecurity Research (FICS), University of Florida, Gainesville,FL, United States
来源：
IEEE Access | 2021年 / 9卷
关键词：
Scanning electron microscopy;
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摘要：
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页码：131955 / 131976
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