A METHOD FOR IMPROVING THE ACCURACY OF SFM 3D MEASUREMENTS BY RANDOM PATTERN PROJECTION

被引：0
|
作者：
Sugano, Miki [1 ]
Kakizaki, Ken'ichi [1 ]
Tominaga, Yasumasa [1 ]
Araki, Shunsuke [1 ]
机构：
[1] Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Japan
来源：
AIJ Journal of Technology and Design | 2023年 / 29卷 / 71期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
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页码：533 / 537
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