Low temperature Raman and X-ray diffraction studies on Fe intercalated VSe2

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作者
Sonika [1 ]
Singh, Yogendra [1 ,2 ]
Yadav, C.S. [1 ]
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[1] School of Basic Sciences, Indian Institute of Technology Mandi, Kamand Mandi,H.P.,175005, India
[2] Special Centre for Nanosciences, Jawaharlal Nehru University, New Delhi,110067, India
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Charge density - Inorganic compounds - Metal insulator transition - Spectroscopic analysis - Temperature - X ray diffraction - Electronic properties - Charge density waves - Iron;
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摘要
1T-VSe2 is known to show charge density wave (CDW) below ~ 110 K. The intercalation of Fe suppresses the CDW transition and induces a metal to insulator like transition near 165 K. We have performed low temperature structural and Raman studies on the FexVSe2 (x = 0, 0.10, 0.25) compounds, besides the electronic and thermal transport studies to understand the nature of this transition. The low temperature x-ray diffraction patterns of the intercalated compound show a distinct change in c - parameter of the unit cell and the Raman spectroscopic studies shows a shift in Eg mode (~ 246–252 cm−1) in the transition regime. Absence of any anomaly in the Seebeck coefficient near the transition rules out the possibility of Fermi surface driven changes in the electronic properties. These observations suggest the importance of structural distortion in the electronic properties of the Fe intercalated VSe2. Our low temperature Raman study in the temperature range 80–300 K, highlights the fact that A1g mode (at ~ 205 cm−1) and Eg mode (at ~ 255 cm−1) are not linked to the CDW state of 1T-VSe2 and are observed for the FexVSe2 as well. © 2021 Elsevier B.V.
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