Vulnerabilities mapping based on OWASP-SANS: A survey for static application security testing (SAST)

被引：0
|
作者：
Li, Jinfeng [1 ]
机构：
[1] Department of Electrical and Electronic Engineering, Imperial College London, London, United Kingdom
来源：
Annals of Emerging Technologies in Computing | 2020年 / 4卷 / 03期
关键词：
21;
D O I：
10.33166/AETiC.2020.03.001
中图分类号：
学科分类号：
摘要：
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页码：1 / 8
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