A Modified Noise Model of Electrical Impedance Tomography System by Considering Colored Noises

被引：0
|
作者：
Bai, Xu [1 ]
Sun, Jiangtao [1 ]
Bai, Xue [1 ]
Sun, Shijie [1 ]
Xu, Lijun [1 ]
机构：
[1] School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing,100191, China
来源：
IEEE Transactions on Instrumentation and Measurement | 2022年 / 71卷
基金：
中国国家自然科学基金;
关键词：
Colored noise - Electrical impe dance tomography (EIT) - Integrated circuit modeling - Noise models - Performance - Power harmonic filters - Ratio analysis - Signal-to-noise ratio improvement - Tomography system;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Sufficient signal-to-noise ratio (SNR) is critical to guarantee the satisfactory performance of an electrical impedance tomography (EIT) system. In this article, a thorough SNR analysis of EIT systems is presented. Besides the well-known random noise, the influences of colored noises, such as switching noise, low-frequency noise, and harmonic noise, are considered. By investigating the colored noises, a novel noise model of electrical impedance tomography systems is first proposed, which is validated by both simulation and experiment conducted in a laboratory-built electrical impedance tomography system. Finally, different conventional methods to reduce the colored noises are discussed and associated circuit-level considerations are evaluated by applying a front-end isolation structure in the laboratory-built EIT system. Overall, this work provides a more practical noise model of electrical impedance tomography systems by including the colored noises. It can serve as a guide to improve the SNR and therefore the performance of an electrical impedance tomography system for high-demanding biomedical applications. © 1963-2012 IEEE.
引用
收藏
相关论文
共 50 条
  • [1] A Modified Noise Model of Electrical Impedance Tomography System by Considering Colored Noises
    Bai, Xu
    Sun, Jiangtao
    Bai, Xue
    Sun, Shijie
    Xu, Lijun
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 71
  • [2] A Low Noise Power Design for Electrical Impedance Tomography System
    Guo, Yanyan
    Chen, Xiaoyan
    Yang, Yongzheng
    [J]. APPLIED MECHANICS, MATERIALS AND MANUFACTURING IV, 2014, 670-671 : 1159 - 1162
  • [3] A electrical impedance tomography system
    Peng, Y
    Mo, YL
    [J]. IEEE EMBS APBME 2003, 2003, : 280 - 281
  • [4] Modified sparse regularization for electrical impedance tomography
    Fan, Wenru
    Wang, Huaxiang
    Xue, Qian
    Cui, Ziqiang
    Sun, Benyuan
    Wang, Qi
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2016, 87 (03):
  • [5] Model Simplification for Electrical Impedance Tomography
    Chin, Renee Ka Yin
    Kho, Gavin Thong Xian
    Tham, Heng Jin
    Chua, Bih Lii
    Teo, Kenneth Tze Kin
    Ng, Kwan Hoong
    [J]. ADVANCED SCIENCE LETTERS, 2017, 23 (11) : 11489 - 11493
  • [6] A Measurement System for Electrical Impedance Tomography
    Kriz, T.
    Roubal, Z.
    Rez, J.
    [J]. PIERS 2013 STOCKHOLM: PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM, 2013, : 905 - 909
  • [7] Low-noise measurement for electrical impedance tomography
    Rafiei-Naeini, M.
    Wright, P.
    McCann, H.
    [J]. 13TH INTERNATIONAL CONFERENCE ON ELECTRICAL BIOIMPEDANCE AND THE 8TH CONFERENCE ON ELECTRICAL IMPEDANCE TOMOGRAPHY 2007, 2007, 17 : 324 - 327
  • [8] Incorporating knowledge on the measurement noise in electrical impedance tomography*
    Dambrine, Marc
    Harbrecht, Helmut
    Puig, Benedicte
    [J]. ESAIM-CONTROL OPTIMISATION AND CALCULUS OF VARIATIONS, 2019, 25
  • [9] Noise-based correction for electrical impedance tomography
    Mason, Kai
    Maurino-Alperovich, Florencia
    Holder, David
    Aristovich, Kirill
    [J]. PHYSIOLOGICAL MEASUREMENT, 2024, 45 (06)
  • [10] A Comprehensive Noise Model for Wideband and High Frame Rate Electrical Impedance Tomography Systems
    Bai, Xu
    Sun, Jiangtao
    Liu, Kangqi
    Li, Xiaolin
    Xu, Lijun
    [J]. IEEE SENSORS JOURNAL, 2023, 23 (13) : 14253 - 14263
12345