共 30 条
- [1] BUTTERWORTH J, PAO L, ABRAMOVITCH D., A comparison of control architectures for atomic force microscopes, Asian Journal of Control, 11, 2, pp. 175-181, (2009)
- [2] DEVASIA S., Should model-based inverse inputs be used as feedforward under plant uncertainty?, IEEE Transactions on Automatic Control, 47, 11, pp. 1865-1871, (2002)
- [3] VAN DER MEULEN S, TOUSAIN R, BOSGRA O., Fixed structure feedforward controller design exploiting iterative trials: Application to a wafer stage and a desktop printer, Journal of Dynamic Systems, Measurement, and Control, 130, 5, (2008)
- [4] REN J, ZOU Q, LI B, Et al., High-speed atomic force microscope imaging: adaptive multi-loop mode, Physical Review E, 90, 1, (2014)
- [5] STEARNS H, YU S W, FINE B, Et al., A comparative study of feedforward tuning methods for wafer scanning systems, ASME Dynamic Systems and Control Conference, pp. 669-676, (2008)
- [6] BRISTOW D, THARAYIL M, ALLEYNE A., A survey of iterative learning control: A learning-based method for high performance tracking control, IEEE Control Systems Magazine, 26, 3, pp. 96-114, (2006)
- [7] NORRLOF M., Iterative learning control-analysis, design, and experiments, (2000)
- [8] JANSSENS P, PIPELEERS G, SWEVERS J., A data-driven constrained norm-optimal iterative learning control framework for LTI systems, IEEE Transactions on Control Systems Technology, 21, 2, pp. 546-551, (2013)
- [9] HOELZLE D, ALLEYNE A, JOHNSON A., Basis task approach to iterative learning control with applications to micro-robotic deposition, IEEE Transactions on Control Systems Technology, 19, 5, pp. 1138-1148, (2011)
- [10] BLANKEN L, BOEREN F, BRUIJNEN D, Et al., Rational iterative feedforward tuning approaches stable inversion and experimental comparison, American Control Conference, pp. 2629-2634, (2016)