Enhanced thermoelectric performance of Cr-doped ZnSb through lattice thermal conductivity reduction below the phonon glass limit

被引:2
|
作者
Kang, Sung Hyun [1 ]
Heo, Minsu [2 ]
Jung, Yong-Jae [3 ,4 ]
Lee, Jeong Min [1 ]
Jeong, Changhui [2 ]
Koo, Sang-Mo [1 ]
Nam, Woo Hyun [3 ]
Cho, Jung Young [3 ]
Lee, Kyu Hyoung [4 ]
Kim, Hyun-Sik [2 ]
Shin, Weon Ho [1 ]
机构
[1] Kwangwoon Univ, Dept Elect Mat Engn, Seoul 01897, South Korea
[2] Univ Seoul, Dept Mat Sci & Engn, Seoul 02504, South Korea
[3] Korea Inst Ceram Engn & Technol, Adv Mat Convergence R&D Div, Jinju 52851, South Korea
[4] Yonsei Univ, Dept Mat Sci & Engn, Seoul 03722, South Korea
基金
新加坡国家研究基金会;
关键词
Thermoelectrics; ZnSb; Cr doping; Debye-Callaway model; Phonon glass limit; TRANSPORT; HEAT;
D O I
10.1016/j.jallcom.2024.175402
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Zinc antimonide (ZnSb) is a promising thermoelectric material due to its economic viability, elemental abundance, and superior phase stability compared to other Zn-Sb compounds. However, its widespread application is hindered by a low figure-of-merit (zT). Extensive research has explored doping, alloying, and nanostructuring to improve zT. This study investigates the impact of Cr doping in CryZn1-ySb (y = 0.0 - 0.03). Cr doping with y = 0.01 significantly reduces lattice thermal conductivity below the phonon glass limit. Debye-Callaway model calculations suggest a combined effect of point defects and decreased grain size caused by Cr incorporation. This reduction translates to enhanced thermoelectric performance, with the y = 0.01 sample exhibiting a 70 % improvement in zT at 673 K, reaching-0.67. Exceeding the Cr substitution limit leads to the formation of a detrimental secondary CrSb2 phase, increasing thermal conductivity. The Single Parabolic Band model calculations predict further zT enhancement in y = 0.01 sample to-0.2 at 300 K through optimized carrier concentration (307 % improvement in zT). These findings demonstrate the potential for significant zT improvement in ZnSb via defect engineering and carrier concentration tuning.
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页数:9
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