Electrical Demonstration of an RF Embedded Multichip Module Enabled by Fused-Silica Stitch-Chip Technology

被引:2
|
作者
Zheng, Ting [1 ]
Bakir, Muhannad S. [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
Radio frequency; Device-to-device communication; Copper; Insertion loss; Substrates; Manufacturing; Packaging; Millimeter wave; RF packaging; transmission lines; FINE-PITCH; PACKAGE; INTERCONNECTS; OPTIMIZATION; HEIGHT; DESIGN; LENGTH;
D O I
10.1109/TCPMT.2024.3395538
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An RF multichip module (MCM) using commercial off-the-shelf (COTS) chips is demonstrated with a proposed fused-silica stitch-chip technology for the first time. In this article, simulations indicate that the stitch chip possesses much lower loss than wire/ribbon bonds. Multiple design cases of die-to-die (D2D) interconnects using stitch chips are explored. A bare low noise amplifier (LNA) die and a bare switch die for K/Ka-band are embedded in a package substrate, where the fabricated stitch chips are then assembled. RF characterization is performed for the assembled module. The packaged LNA establishes <1-dB package-induced linear gain degradation and >12-dB return loss, while the interconnected LNA and switch module are functional and establish a 15-dB linear gain. The proposed fused-silica stitch-chip technology is a promising integration solution for future RF modules.
引用
收藏
页码:1172 / 1179
页数:8
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