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- [4] Integrated approach for circuit and fault extraction of VLSI circuits 1996 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 1996, : 96 - 104
- [9] Parametric Fault Detection in Analog Circuits : A Statistical Approach 2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS), 2016, : 275 - 280
- [10] A Novel Approach for Incipient Fault Detection in Analog Circuits 2018 EIGHTH INTERNATIONAL CONFERENCE ON INSTRUMENTATION AND MEASUREMENT, COMPUTER, COMMUNICATION AND CONTROL (IMCCC 2018), 2018, : 289 - 294