Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-channel Simulation

被引：0

作者：

Li, Henian ^{[1
]}

Lin, Lang ^{[2
]}

Chang, Norman ^{[2
]}

Chowdhury, Sreeja ^{[2
]}

Mcguire, Dylan ^{[2
]}

Novakovic, Bozidar ^{[2
]}

Monta, Kazuki ^{[3
]}

Nagata, Makoto ^{[3
]}

Li, Ying-Shiun ^{[2
]}

Pramod, M. S. ^{[2
]}

Yeh, Piin-Chen ^{[4
]}

Jang, J. -S. Roger ^{[4
]}

Xi, Chengjie ^{[1
]}

Jin, Qiutong ^{[5
]}

Asadi, Navid ^{[1
]}

Tehranipoor, Mark ^{[1
]}

机构：

[1] Univ Florida, Gainesville, FL 32611 USA

[2] Ansys Inc, Canonsburg, PA USA

[3] Kobe Univ, Kobe, Hyogo, Japan

[4] Natl Taiwan Univ, Taipei, Taiwan

[5] Univ Calif Berkeley, Berkeley, CA USA

来源：

2024 IEEE INTERNATIONAL SYMPOSIUM ON HARDWARE ORIENTED SECURITY AND TRUST, HOST | 2024年

关键词：

Optical side-channel analysis; security key disclosure; layout-level analysis; photon emission modeling and simulation; machine learning; hardware security; AES; GENERATION;

D O I：

10.1109/HOST55342.2024.10545412

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Optical side-channel analysis poses a significant threat to the security of integrated circuits (ICs) by enabling the disclosure of secret data, such as encryption keys. In this paper, for the first time, we present a multiphysics simulation framework of optical side-channel analysis from the layout database of a fabricated testchip. By leveraging accurate device models and electro-photonic physics, our framework models the photon emission behavior in ICs and enables the statistical correlation of emitted photon patterns with secret keys. Our framework enhances understanding of layout-level optical side-channel leakage and its implications, enabling IC designers to assess the risks associated with optical side-channel attacks and develop efficient countermeasures at the pre-silicon stage.

引用

页码：107 / 111

页数：5

共 14 条

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