Investigation into X-point emissivity in metallic materials for temperature measurement

Amidst the swift progression of thermal radiation, the application of high -temperature spectral radiation characteristics in metallic materials has become pervasive across domains such as temperature measurement and material identification. X -Point is the intersection of the metal emissivity isotherms. The scope of X -point emissivity has been inadequately explored in prior investigations. The present study employs a concerted approach that amalgamates the simulation of the Lorentz-Drude model theory and the emissivity measurement based on the energy contrast method, to comprehensively investigate the X -point emissivity of metal materials. The results demonstrate that: (1) the simulation of X -point emissivity is achieved for the first time by the incorporation of the Lorentz-Drude model of electron -phonon scattering. (2) Validation of the model's feasibility is demonstrated by the measurement of the X -point emissivity of tungsten, and the inaugural measurement of vanadium's X -point emissivity. (3) Pioneeringly, X -point emissivity finds application in metal temperature measurement, exhibiting an accuracy 0.3 % superior to that of pyrometers. This research establishes an effective methodology for the model simulation of metal X -point emissivity and its application in radiation temperature measurement scenarios.