Material removal mechanisms affected by milling modes for defective KDP surfaces (vol 48, pg 67, 2024)

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Bazuin, Timo
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10.1016/j.cirpj.2024.01.003
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T [工业技术];
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08 ;
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页码:287 / 287
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  • [1] Material removal mechanisms affected by milling modes for defective KDP surfaces
    Lei, Hongqin
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    [J]. CIRP JOURNAL OF MANUFACTURING SCIENCE AND TECHNOLOGY, 2024, 48 : 67 - 83
  • [3] Experimental investigation into material removal mechanisms in High Speed Wire EDM (vol 111, pg 2163, 2020)
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    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2021, 116 (3-4): : 1389 - 1389
  • [4] Novel composite of ZnMoO4/Ni(OH)2 as an electrode material for enhanced performance in energy-storage applications (vol 48, pg 7362, 2024)
    Duvaragan, Barani Kumar
    Shanmugam, Ganesan
    Hameed, Arif Mohamed Shahul
    Ramalingam, Vetrivel
    [J]. NEW JOURNAL OF CHEMISTRY, 2024, 48 (35) : 15704 - 15704
  • [5] Local material removal by focused ion beam milling and etching (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 630-635, 1995)
    Lipp, S
    Frey, L
    Franz, G
    Demm, E
    Petersen, S
    Ryssel, H
    [J]. ION BEAM MODIFICATION OF MATERIALS, 1996, : 630 - 635