共 5 条
- [1] A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit With ±3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2023, 70 (06) : 2257 - 2270