Enabling pulse shape discrimination with commercial ASICs
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|
作者:
Leland, John
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机构:
Univ Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USAUniv Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Leland, John
[1
]
Fang, Ming
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机构:
Univ Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USAUniv Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Fang, Ming
[1
]
Pani, Satwik
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机构:
Univ Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Washington Univ, Sch Med, Dept Radiat Oncol, 660 S Euclid Ave, St Louis, MO 63110 USAUniv Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Pani, Satwik
[1
,2
]
Venturini, Yuri
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机构:
CAEN SpA, Via Vetraia 11, I-55049 Viareggio, ItalyUniv Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Venturini, Yuri
[3
]
Locatelli, Marco
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机构:
CAEN Technol Inc, 1 Edgewater St,Suite 101, Staten Isl, NY 10305 USAUniv Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Locatelli, Marco
[4
]
Di Fulvio, Angela
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机构:
Univ Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USAUniv Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
Di Fulvio, Angela
[1
]
机构:
[1] Univ Illinois, Dept Nucl Plasma & Radiol Engn, 104 South Wright St, Urbana, IL 61801 USA
[2] Washington Univ, Sch Med, Dept Radiat Oncol, 660 S Euclid Ave, St Louis, MO 63110 USA
[3] CAEN SpA, Via Vetraia 11, I-55049 Viareggio, Italy
[4] CAEN Technol Inc, 1 Edgewater St,Suite 101, Staten Isl, NY 10305 USA
Silicon photomultiplier;
Pulse shape discrimination;
Application specific integrated circuit;
D O I:
10.1016/j.nima.2024.169438
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
Fast electronic readout for high-channel density scintillator-based systems is needed for radiation tracking and imaging in a wide range of applications, including nuclear physics, nuclear security and nonproliferation. Programmable electronics, like FPGAs and ASICs, provide a fast way of conditioning and processing the signal in real time. In this paper, we present a pulse shape discrimination (PSD) method based on the shaping circuit of a commercially available ASIC, the Citiroc1A by CAEN Technologies. We used two different shaping times per detector channel to calculate a shaping parameter that enables PSD. Using our new method, neutron and gamma-ray pulses detected by a d 12 -stilbene scintillator can be effectively discriminated at light output values greater than 0 . 15 MeVee. While not achieving the PSD performance of traditional offline charge integration, our method does not require the transfer of data to a separate system for further processing and enables the direct deployment of high-channel density multi-particle detection systems. Moreover, the availability of a wider range of shaping times than those on the Citiroc1A can potentially further improve the PSD performance.
机构:
Univ INFN, Dipartimento Fis, I-16146 Genoa, ItalyUniv INFN, Dipartimento Fis, I-20133 Milan, Italy
Caminata, A.
Chepurnov, A.
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机构:
Lomonosov Moscow State Univ, Skobeltsyn Inst Nucl Phys, Moscow 119234, RussiaUniv INFN, Dipartimento Fis, I-20133 Milan, Italy
Chepurnov, A.
Angelo, D. D.
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机构:
Univ INFN, Dipartimento Fis, I-20133 Milan, ItalyUniv INFN, Dipartimento Fis, I-20133 Milan, Italy
Angelo, D. D.
Derbin, A.
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机构:
NRC Kurchatov Inst, St Petersburg Nucl Phys Inst, Gatchina 188350, RussiaUniv INFN, Dipartimento Fis, I-20133 Milan, Italy
Derbin, A.
Di Giacinto, A.
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机构:
INFN Lab Nazl Gran Sasso, I-67010 Assergi, Italy
INFN Lab Nazl Gran Sasso, I-67010 Assergi, ItalyUniv INFN, Dipartimento Fis, I-20133 Milan, Italy
Di Giacinto, A.
Di Marcello, V.
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机构:
INFN Lab Nazl Gran Sasso, I-67010 Assergi, ItalyUniv INFN, Dipartimento Fis, I-20133 Milan, Italy
Di Marcello, V.
Ding, X. F.
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机构:
Princeton Univ, Phys Dept, Princeton, NJ 08544 USA
IHEP Inst High Energy Phys, Beijing 100049, Peoples R ChinaUniv INFN, Dipartimento Fis, I-20133 Milan, Italy