Development of the multiplex imaging chamber at PAL-XFEL

被引:1
|
作者
Hwang, Junha [1 ,2 ,3 ]
Kim, Sejin [1 ,2 ]
Lee, Sung Yun [1 ,2 ,3 ]
Park, Eunyoung [1 ,2 ,3 ]
Shin, Jaeyong [1 ,2 ,3 ]
Lee, Jae Hyuk [2 ,4 ]
Kim, Myong-jin [4 ]
Kim, Seonghan [4 ]
Park, Sang-Youn [4 ]
Jang, Dogeun [4 ]
Eom, Intae [2 ,4 ]
Kim, Sangsoo [4 ]
Song, Changyong [1 ,2 ,3 ]
Kim, Kyung Sook [2 ,4 ]
Nam, Daewoong [2 ,4 ]
机构
[1] Pohang Univ Sci & Technol, Dept Phys, Pohang 37673, South Korea
[2] Pohang Univ Sci & Technol, Photon Sci Ctr, Pohang 37673, South Korea
[3] Max Planck POSTECH Korea Res Initiat, Ctr Ultrafast Sci Quantum Matter, Pohang 37673, South Korea
[4] Pohang Univ Sci & Technol, XFEL Beamline Dept, Pohang Accelerator Lab, Pohang 37673, South Korea
基金
新加坡国家研究基金会;
关键词
coherent diffraction imaging; wide-angle X-ray diffraction; X-ray emission spectroscopy; XFELs; ultrafast dynamics; FREE-ELECTRON LASER; RAY; DYNAMICS;
D O I
10.1107/S1600577524001218
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Various X-ray techniques are employed to investigate specimens in diverse fields. Generally, scattering and absorption/emission processes occur due to the interaction of X-rays with matter. The output signals from these processes contain structural information and the electronic structure of specimens, respectively. The combination of complementary X-ray techniques improves the understanding of complex systems holistically. In this context, we introduce a multiplex imaging instrument that can collect small-/wide-angle X-ray diffraction and X-ray emission spectra simultaneously to investigate morphological information with nanoscale resolution, crystal arrangement at the atomic scale and the electronic structure of specimens.
引用
收藏
页码:469 / 477
页数:9
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