Package Design and Analysis of a 20-kV Double-Sided Silicon Carbide Diode Module With Polymer Nanocomposite Field-Grading Coating

被引:4
|
作者
Zhang, Zichen [1 ,2 ]
Arriola, Emmanuel [1 ,2 ]
Nicholas, Carl [1 ,2 ]
Lynch, Justin [3 ]
Yun, Nick [3 ]
Morgan, Adam [4 ]
Sung, Woongje [3 ]
Ngo, Khai D. T. [1 ,2 ]
Lu, Guo-Quan [1 ,2 ,5 ]
机构
[1] Virginia Tech, Bradley Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
[2] Virginia Tech, CPES, Blacksburg, VA 24061 USA
[3] SUNY Albany, Dept Nanoscale Sci & Engn, Albany, NY 12203 USA
[4] NoMIS Power, Albany, NY 12204 USA
[5] Virginia Tech, Dept Mat Sci & Engn, Blacksburg, VA 24061 USA
关键词
Medium-voltage (MV); packaging; partial discharge (PD); reliability; silicon carbide (SiC) module; thermal management; POWER DEVICES;
D O I
10.1109/TCPMT.2024.3381090
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To tackle the insulation challenges present in packaging medium-voltage (MV) silicon carbide (SiC) power devices, we developed a package design for a 20-kV SiC. This design incorporates a nonlinear resistive polymer-nanoparticle composite to boost insulation without compromising thermal performance. Employing a "sandwich" structure, where diodes are connected between direct-bonded copper (DBC) substrates, our approach minimizes parasitic inductance (< 4.5 nH) through a wire-bond-less design. According to thermal simulations, this configuration leads to a junction temperature reduction up to 53.5 degrees C. The submodule configuration not only cuts the total deformation by a factor of three but also enhances both reliability and manufacturability. By coating the electrode triple points with the resistive composite, electric field (E-field) stress is diminished. Experimental tests indicated a 96% rise in the partial discharge (PD) inception voltage of substrates, increasing from 15.6 to 30.6 kV. For validation, scaled-down packages equipped with SiC diodes exceeding 16 kV were fabricated and put through rigorous testing.
引用
收藏
页码:776 / 783
页数:8
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