Accumulation of Long-Lived Photogenerated Holes at Indium Single-Atom Catalysts via Two Coordinate Nitrogen Vacancy Defect Engineering for Enhanced Photocatalytic Oxidation

被引:2
|
作者
Zhang, Jingjing [1 ]
Yang, Xuan [1 ]
Xu, Guofang [1 ]
Biswal, Basanta Kumar [1 ]
Balasubramanian, Rajasekhar [1 ]
机构
[1] Natl Univ Singapore, Dept Civil & Environm Engn, 1 Engn Dr 2, Singapore 117576, Singapore
基金
新加坡国家研究基金会;
关键词
carbon nitride; degradation of antibiotics; indium; photocatalytic oxidation; photogenerated holes; single-atom photocatalysts; CARBON NITRIDE; SPECTROSCOPY; NANOSHEETS; EVOLUTION; ENERGY; WATER; TIO2;
D O I
10.1002/adma.202309205
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Visible-light-driven photocatalytic oxidation by photogenerated holes has immense potential for environmental remediation applications. While the electron-mediated photoreduction reactions are often at the spotlight, active holes possess a remarkable oxidation capacity that can degrade recalcitrant organic pollutants, resulting in nontoxic byproducts. However, the random charge transfer and rapid recombination of electron-hole pairs hinder the accumulation of long-lived holes at the reaction center. Herein, a novel method employing defect-engineered indium (In) single-atom photocatalysts with nitrogen vacancy (Nv) defects, dispersed in carbon nitride foam (In-Nv-CNF), is reported to overcome these challenges and make further advances in photocatalysis. This Nv defect-engineered strategy produces a remarkable extension in the lifetime and an increase in the concentration of photogenerated holes in In-Nv-CNF. Consequently, the optimized In-Nv-CNF demonstrates a remarkable 50-fold increase in photo-oxidative degradation rate compared to pristine CN, effectively breaking down two widely used antibiotics (tetracycline and ciprofloxacin) under visible light. The contaminated water treated by In-Nv-CNF is completely nontoxic based on the growth of Escherichia coli. Structural-performance correlations between defect engineering and long-lived hole accumulation in In-Nv-CNF are established and validated through experimental and theoretical agreement. This work has the potential to elevate the efficiency of overall photocatalytic reactions from a hole-centric standpoint. Here, a novel method employing defect-engineered indium (In) single-atom photocatalysts with nitrogen vacancy (Nv) defects, dispersed in carbon nitride foam (In-Nv-CNF), is reported to make further advances in visible-light-driven photocatalysis. The engineered two coordinated nitrogen (N2C) vacancies induce a defect state serving as an effective electron trap, thus extending the lifetime of photogenerated holes and concentrating holes at In atom sites. image
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页数:15
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